Program Committee

  • Anurag Agarwal, University of South Florida, USA
  • Cristina Alcaraz, University of Malaga, Spain
  • Adiel Almeida, Federal University of Pernambuco, Brazil
  • Mariusz Andrzejczak, Industrial Research Institute for Automation and Measurements, Poland
  • Zhuming Bi, Indiana University Purdue University Fort Wayne, USA
  • Larissa Bulysheva, Old Dominion University, USA
  • Sohail Chaudhry, Villanova University, USA
  • Wei Chen, Wuhan University of Technology, China
  • Xiaochun Cheng, Middlesex University, UK
  • Marco Comuzzi, Ulsan National Institute of Science and Technology, South Korea
  • Suzana de França Dantas Daher, Federal University of Pernambuco, Brazil
  • Lian Duan, Hofstra University, USA
  • Anjee Gorkhali, Tribhuvan University, Nepal
  • Jingzhi Guo, University of Macau, China
  • Madan Gupta, University of Saskatchewan, Canada
  • W.H. Ip, Hong Kong Polytechnic University, China
  • Lihong Jiang, Shanghai Jiao Tong University, China
  • Björn Johansson, Lund University, Sweden
  • Mikhail Yu Kataev, Tomsk State University of Control Systems and Radioelectronics, Russia
  • Gang Li, Deakin University, Australia
  • Lefei Li, Tsinghua University, China
  • Ling Li, Old Dominion University, USA
  • Per Närman, Royal Institute of Technology, Sweden
  • Nan Niu, University of Cincinnati, USA
  • Zhibo Pang, ABB Corporate Research, Sweden
  • Wenan Tan, Shanghai Second Polytechnic University, China
  • Ricardo Valerdi, University of Arizona, USA
  • Wattana Viriyasitavat, Chulalongkorn University, Thailand
  • Chengen Wang, Shanghai Jiao Tong University, China
  • Pan Wang, Wuhan University of Technology, China
  • Eric Xu, University of Minnesota, USA
  • Wangtu Xu, Xiamen University, China
  • Po Yang, Liverpool John Moores University, UK
  • Ming Yu, Florida State University, USA
  • Yale Yu, Infosys Australia & New Zealand, Australia
  • Chris Zhang, University of Saskatchewan, Canada
  • Xianrong Zheng, Old Dominion University, USA
  • Shangming Zhou, Swansea University, UK
  • Zhuo Zuo, Royal Institute of Technology, Sweden

Organizer

Technical Sponsor


Sponsors


Publication